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Microstructure and X-Ray Diffraction analysis of Al-Cu Couples Diffused at High Temperature |
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| รหัสดีโอไอ | |
| Creator | Jaime HINOJOSA-TORRES,Juan MANUELACEVES-HERN?NDEZ,Andres HERRERA-V?ZQUEZ,Victor MANUELCASTA?O-MENESES |
| Title | Microstructure and X-Ray Diffraction analysis of Al-Cu Couples Diffused at High Temperature |
| Publisher | Metallurgy and Materials Science Research Institute, Chulalongkorn University |
| Publication Year | 2558 |
| Journal Title | Journal of Metals, Materials and Minerals |
| Journal Vol. | 25 |
| Journal No. | 2 |
| Page no. | 37-43 |
| Keyword | Al-Cu Couples,?2 phase plate like,? phase plate like,Welding line,Weld bead |
| ISSN | 8576149 |
| Abstract | By employing a thermal field of 813 K, couples of Al with Cu were welded as consequence of the atomic diffusion. The periods of permanency inside the field were 200, 320 and 480 hours. After the periods of test, SEM observations show the formation of two contiguous plate likes (~15 to 30 micrometres, width) that they are in normal position to the concentration gradient. By utilizing elemental analyses and X-ray diffraction techniques one plate like was identified as the h2phase (CuAl) and the other one as the qphase (CuAl2) of the aluminium-copper system. Immediate to the qplate like it is expanded a zone formed by irregular q grains surrounded by a network of aAL. Finally, far from the welding line, the saturated q grains decompose and transform into pearlite according to the reaction aAl + q?aAl + aCu. |
