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Optimization of Suitable Formvar Film Thickness Using AFM to Support Ultrathin Specimen for TEM |
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| รหัสดีโอไอ | |
| Creator | P. Thanomchat |
| Title | Optimization of Suitable Formvar Film Thickness Using AFM to Support Ultrathin Specimen for TEM |
| Contributor | Y. Paopun |
| Publisher | The Microscopy Society of Thailand |
| Publication Year | 2563 |
| Journal Title | Microscopy and Microanalysis Research - The Journal of The Microscopy Society of Thailand |
| Journal Vol. | 33 |
| Journal No. | 1 |
| Page no. | 18-21 |
| Keyword | formvar film, atomic force microscopy, preparation |
| URL Website | https://ph02.tci-thaijo.org/index.php/mmres/index |
| Website title | Microscopy and Microanalysis Research - The Journal of The Microscopy Society of Thailand |
| ISSN | 2651-2297 (online) |
| Abstract | Formvar is a polyvinyl formaldehyde polymer used to support specimen for transmission electron microscopic (TEM) study. It is appropriate as a film supporting because it is resistant to electron beam. In this study, formvar films were prepared by dipping with 0.20, 0.25 and 0.30 percent formvar solutions for 3, 5, 8 and 10 seconds on glass slides. The thicknesses of the films were observed using an atomic force microscope (AFM). Result showed that the film thickness varied upon the formvar concentrations and the casting times. The suitable film thicknesses were obtained from 0.20 percent solution with 10 seconds, 0.25 percent with 5-10 seconds and 0.30 percent with 3-8 seconds casting times. For the overall of this study, it was found that the film thicknesses between 32.14ฑ1.89-56.39ฑ5.30 nanometers were suitable to support the specimens for TEM |
