Evaluation of informative spectral wavelengths for estimating soluble solids content in sugarcane billets
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Creator 1. Vasu Udompetaikul
2. Kittisak Phetpan
3. Panmanas Sirisomboon
Title Evaluation of informative spectral wavelengths for estimating soluble solids content in sugarcane billets
Publisher Faculty of Engineering, Khon Kaen University
Publication Year 2565
Journal Title Engineering and Applied Science Research
Journal Vol. 49
Journal No. 4
Page no. 581-586
Keyword Sugarcane, Yield, Quality, Monitoring system, Near-infrared, Soluble solids
URL Website https://ph01.tci-thaijo.org/index.php/easr/index
Website title Engineering and Applied Science Research
ISSN 2539-6161
Abstract This study proposed individual spectral wavelengths significant to estimate soluble solids content (SSC) in sugarcane billets moving on the conveyor. At the same time, an all-in-one quality and yield monitor using those wavelengths for a sugarcane harvester was also proposed. Seven wavelengths, 475, 560, 668, 717, 755, 840, and 890 nm, were arranged into three groups for modeling. Group 1, consisting of 475, 560, 668, 717, and 840 nm, was based on the spectral responses of a commercial multispectral camera, while group 2 (717 and 840 nm) was based on the invisible (RedEdge and near-infrared or NIR) responses of the camera. For group 3, two sugar-related wavelengths at 755 and 890 nm were selected as the candidates for modeling. Partial least squares regression (PLSR) was employed to model those three groups with corresponding soluble solids content (SSC). The results showed that the developed models based on two sugar-related wavelengths at 755 and 890 nm provided the best performance, explaining 80.2 % of the variance in the SSC and displaying a root mean square error of calibration (RMSEC) of 0.32 ?Brix. The predictive performance had the root mean square error of prediction (RMSEP) of 0.33 ?Brix. This finding confirmed the effectiveness of the sugar wavelengths and conveyed the possibility to develop the sugarcane quality and yield monitor.
Engineering and Applied Science Research

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